State-of-the-art of Power Cycling Lifetime Models for Power Electronics

Power electronics are pivotal components in energy conversion, and their reliability critically influences the long-term operational stability of a system. The power cycling test is one of the most essential tests for reliability research, and lifetime models derived from experimental data or simulations are commonly employed to predict long-term reliability. Numerous lifetime models that reflect a range of test methodologies, operating conditions, failure mechanisms, packaging types, and stress scenarios have been proposed. The adoption of appropriate lifetime models is crucial for the accurate estimation and prediction of the remaining lifetime. In this paper, the foundational principles and build-up process of lifetime models are introduced. Furthermore, the existing lifetime models for power electronics are thoroughly reviewed and categorized from various perspectives, including analytical and physical approaches, traditional wire-bonded versus press-pack insulated gate bipolar transistors (IGBTs), power modules versus discrete devices, elastic versus plastic deformation, low-cycle versus high-cycle fatigue, and uniaxial versus multiaxial stress conditions. The advantages and limitations of each model, along with their respective applicability contexts, are analyzed. Based on this comprehensive review, recommendations are provided for selecting suitable lifetime models for fatigue analysis in power electronics.