超高压串补测量系统接触类故障深入性研究 *
In-depth Study on the Contact Fault of Ultra-high Voltage SC Measurement System
超高压串补测量系统接触类故障深入性研究 * |
| 祁宝才, 李永滨, 马顺绪, 李斌, 喻劲松, 答科超 |
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In-depth Study on the Contact Fault of Ultra-high Voltage SC Measurement System |
| QI Baocai, LI Yongbin, MA Shunxu, LI Bin, YU Jinsong, DA Kechao |
| 图10 现场损坏DB9数据线接口测试录波图 |
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